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[IEEE 2011 IEEE 4th International Nanoelectronics Conference (INEC) - Tao-Yuan, Taiwan (2011.06.21-2011.06.24)] The 4th IEEE International NanoElectronics Conference - Independent double-gate FinFET SRAM technology

✍ Scribed by Endo, Kazuhiko; O'uchi, Shi-ichi; Matsukawa, Takashi; Liu, Yongxun; Masahara, Meishoku

Book ID: 115445877
Publisher: IEEE
Year: 2011
Weight: 666 KB
Volume: 0
Category: Article
ISBN: 1457703793
DOI: 10.1109/inec.2011.5991796

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