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[IEEE 2011 IEEE 4th International Nanoelectronics Conference (INEC) - Tao-Yuan, Taiwan (2011.06.21-2011.06.24)] The 4th IEEE International NanoElectronics Conference - X-ray diffraction analysis of self-ordered porous anodic alumina

✍ Scribed by Wu, Ya-Fen; Huang, Jeng-Kuang; Lee, Jiunn-Chyi

Book ID: 120584369
Publisher: IEEE
Year: 2011
Weight: 651 KB
Category: Article
ISBN: 1457703793
DOI: 10.1109/INEC.2011.5991726

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