✦ LIBER ✦

[IEEE 2011 IEEE 4th International Nanoelectronics Conference (INEC) - Tao-Yuan, Taiwan (2011.06.21-2011.06.24)] The 4th IEEE International NanoElectronics Conference - Nano-scale Si-capping thicknesses impacting junction performance on silicon substrate

✍ Scribed by Wang, Mu-Chun; Yang, Ren-Hau; Liao, Wen-Shiang; Yang, Hsin-Chia; Li, Yi-Jhen; Huang, Heng-Sheng

No coin nor oath required. For personal study only.

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