✦ LIBER ✦

[IEEE 2011 IEEE 4th International Nanoelectronics Conference (INEC) - Tao-Yuan, Taiwan (2011.06.21-2011.06.24)] The 4th IEEE International NanoElectronics Conference - Embedded SiGe source/drain and temperature degrading junction performance on 45 nm MOSFETs

✍ Scribed by Wang, Mu-Chun; Lin, Long-Sian; Huang, Heng-Sheng; Liao, Wen-Shiang; Yang, Ren-Hau; Yang, Hsin-Chia

No coin nor oath required. For personal study only.

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