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[IEEE 2011 IEEE 4th International Nanoelectronics Conference (INEC) - Tao-Yuan, Taiwan (2011.06.21-2011.06.24)] The 4th IEEE International NanoElectronics Conference - Study of temperature effects of mobility, swing, and early voltages on strained MOSFET devices

โœ Scribed by Yang, Hsin-Chia; Peng, Huei-Jyun; Liao, Wen-Shiang; Yeh, Jhe-Chuan; Wang, Mu-Chun


Book ID
115540977
Publisher
IEEE
Year
2011
Weight
252 KB
Volume
0
Category
Article
ISBN
1457703793

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