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[IEEE 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010) - Corfu, Greece (2010.07.5-2010.07.7)] 2010 IEEE 16th International On-Line Testing Symposium - Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts

✍ Scribed by Rech, P.; Grosso, M.; Melchiori, F.; Loparco, D.; Appello, D.; Dilillo, L.; Paccagnella, A.; Reorda, M. Sonza

Book ID: 121435223
Publisher: IEEE
Year: 2010
Weight: 194 KB
Category: Article
ISBN: 1424477247
DOI: 10.1109/IOLTS.2010.5560236

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