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[IEEE 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010) - Corfu, Greece (2010.07.5-2010.07.7)] 2010 IEEE 16th International On-Line Testing Symposium - Predictive error detection by on-line aging monitoring

✍ Scribed by Vazquez, J. C.; Champac, V.; Ziesemer, A. M.; Reis, R.; Semiao, J.; Teixeira, I. C.; Santos, M. B.; Teixeira, J. P.

Book ID: 121248779
Publisher: IEEE
Year: 2010
Weight: 944 KB
Category: Article
ISBN: 1424477247
DOI: 10.1109/IOLTS.2010.5560241

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