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[IEEE 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010) - Corfu, Greece (2010.07.5-2010.07.7)] 2010 IEEE 16th International On-Line Testing Symposium - Robust FSMs for cryptographic devices resilient to strong fault injection attacks

✍ Scribed by Wang, Zhen; Karpovsky, Mark

Book ID: 118144171
Publisher: IEEE
Year: 2010
Weight: 299 KB
Volume: 0
Category: Article
ISBN: 1424477247
DOI: 10.1109/iolts.2010.5560195

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