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[IEEE 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010) - Corfu, Greece (2010.07.5-2010.07.7)] 2010 IEEE 16th International On-Line Testing Symposium - Fully distributed initialization procedure for a 2D-Mesh NoC, including off-line BIST and partial deactivation of faulty components

✍ Scribed by Zhang, Zhen; Greiner, Alain; Benabdenbi, Mounir

Book ID: 121386377
Publisher: IEEE
Year: 2010
Weight: 274 KB
Category: Article
ISBN: 1424477247
DOI: 10.1109/IOLTS.2010.5560209

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