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[IEEE 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010) - Corfu, Greece (2010.07.5-2010.07.7)] 2010 IEEE 16th International On-Line Testing Symposium - Aging test strategy and adaptive test scheduling for SoC failure prediction

✍ Scribed by Yi, Hyunbean; Yoneda, Tomokazu; Inoue, Michiko; Sato, Yasuo; Kajihara, Seiji; Fujiwara, Hideo

Book ID: 121294077
Publisher: IEEE
Year: 2010
Weight: 265 KB
Category: Article
ISBN: 1424477247
DOI: 10.1109/IOLTS.2010.5560239

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