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[IEEE 2010 5th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) - Taipei, Taiwan (2010.10.20-2010.10.22)] 2010 5th International Microsystems Packaging Assembly and Circuits Technology Conference - Dynamic electrical resistance effects in resistance spot welding

✍ Scribed by Wu, T. H.; Ho, J. E.; Wei, P. S.

Book ID: 111868100
Publisher: IEEE
Year: 2010
Weight: 134 KB
Volume: 0
Category: Article
ISBN: 1424497833
DOI: 10.1109/impact.2010.5699534

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