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[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - Low-capture-power at-speed testing using partial launch-on-capture test scheme

✍ Scribed by Chen, Zhen; Xiang, Dong

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