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[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - At-speed scan test with low switching activity

✍ Scribed by Moghaddam, Elham K.; Rajski, Janusz; Kassab, Mark; Reddy, Sudhakar M.

Book ID: 120186620
Publisher: IEEE
Year: 2010
Weight: 972 KB
Category: Article
ISBN: 1424466490
DOI: 10.1109/VTS.2010.5469580

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