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[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - Theoretical analysis for low-power test decompression using test-slice duplication

✍ Scribed by Mu, Szu-Pang; Chao, Mango C.-T.

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