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[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - A novel hybrid delay testing scheme with low test power, volume, and time

✍ Scribed by Chen, Zhen; Seth, Sharad; Xiang, Dong

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