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[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Derivation of Optimal Test Set for Detection of Multiple Missing-Gate Faults in Reversible Circuits

✍ Scribed by Kole, Dipak K.; Rahaman, Hafizur; Das, Debesh K.; Bhattacharya, Bhargab B.

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