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[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Defect Coverage-Driven Window-Based Test Compression

✍ Scribed by Kavousianos, Xrysovalantis; Chakrabarty, Krishnendu; Kalligeros, Emmanouil; Tenentes, Vasileios

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