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[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Modified Scan Flip-Flop for Low Power Testing

✍ Scribed by Mishra, Amit; Sinha, Nidhi; Satdev, ; Singh, Virendra; Chakravarty, Sreejit; Singh, Adit D.

No coin nor oath required. For personal study only.

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