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[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - A Comprehensive System-on-Chip Logic Diagnosis

✍ Scribed by Benabboud, Y.; Bosio, A.; Dilillo, L.; Girard, P.; Pravossoudovitch, S.; Virazel, A.; Riewer, O.

No coin nor oath required. For personal study only.

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