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[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Circuit Topology-Based Test Pattern Generation for Small-Delay Defects

✍ Scribed by Goel, Sandeep Kumar; Chakrabarty, Krishnendu; Yilmaz, Mahmut; Peng, Ke; Tehranipoor, Mohammad

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