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[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Capture in Turn Scan for Reduction of Test Data Volume, Test Application Time and Test Power

✍ Scribed by You, Zhiqiang; Huang, Jiedi; Inoue, Michiko; Kuang, Jishun; Fujiwara, Hideo

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