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[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - On-the-Fly Reduction of Stimuli for Functional Verification

✍ Scribed by Guo, Qi; Chen, Tianshi; Shen, Haihua; Chen, Yunji; Hu, Weiwu

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