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[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Threshold voltage shift in FIB circuit edit of embedded flash device

✍ Scribed by Joon Chai Yeoh, ; Chong, KC; Khairizam, A.R.; Sim, Mei-Mei I.; Meng Chuan Lee, ; Susan Li,

Book ID: 126705258
Publisher: IEEE
Year: 2010
Weight: 527 KB
Category: Article
ISBN: 1424455960
DOI: 10.1109/IPFA.2010.5532305

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