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[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Hot-carrier degradation modeling using full-band Monte-Carlo simulations

✍ Scribed by Tyaginov, S.E.; Starkov, I.A.; Triebl, O.; Cervenka, J.; Jungemann, C.; Carniello, S.; Park, J.M.; Enichlmair, H.; Karner, M.; Kernstock, Ch.; Seebacher, E.; Minixhofer, R.; Ceric, H.; Grasser, T.

Book ID: 121273125
Publisher: IEEE
Year: 2010
Weight: 486 KB
Category: Article
ISBN: 1424455960
DOI: 10.1109/IPFA.2010.5532001

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