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[IEEE 2009 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2009.04.28-2009.04.30)] 2009 International Symposium on VLSI Design, Automation and Test - A 6-GS/s, 6-bit, at-speed testable ADC and DAC pair in 0.13µm CMOS

✍ Scribed by Chen-Kang Ho, ; Hao-Chiao Hong,

Book ID: 121219696
Publisher: IEEE
Year: 2009
Weight: 255 KB
Category: Article
ISBN: 1424427819
DOI: 10.1109/VDAT.2009.5158131

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