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[IEEE 2009 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2009.04.28-2009.04.30)] 2009 International Symposium on VLSI Design, Automation and Test - Transforming RF and mm-Wave CMOS circuits

✍ Scribed by Niknejad, Ali M.; Chowdhury, Debopriyo

Book ID: 115476227
Publisher: IEEE
Year: 2009
Weight: 302 KB
Volume: 0
Category: Article
ISBN: 1424427819
DOI: 10.1109/vdat.2009.5158114

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