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[IEEE 2009 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2009.04.28-2009.04.30)] 2009 International Symposium on VLSI Design, Automation and Test - Improved SPICE macromodel of phase change random access memory

✍ Scribed by Huan-Lin Chang, ; Hung-Chih Chang, ; Shang-Chi Yang, ; Hsi-Chun Tsai, ; Hsuan-Chih Li, ; Liu, C. W.

Book ID: 115538102
Publisher: IEEE
Year: 2009
Weight: 535 KB
Volume: 0
Category: Article
ISBN: 1424427819
DOI: 10.1109/vdat.2009.5158113

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