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[IEEE 2009 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2009.04.28-2009.04.30)] 2009 International Symposium on VLSI Design, Automation and Test - A bias-driven approach for automated design of operational amplifiers

✍ Scribed by Cheng-Wu Lin, ; Pin-Dai Sue, ; Ya-Ting Shyu, ; Soon-Jyh Chang,

Book ID: 121702881
Publisher: IEEE
Year: 2009
Weight: 250 KB
Category: Article
ISBN: 1424427819
DOI: 10.1109/vdat.2009.5158109

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