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[IEEE 2009 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2009.04.28-2009.04.30)] 2009 International Symposium on VLSI Design, Automation and Test - Past, present and future of RF design in wireless communication

✍ Scribed by Chien, George; Loh, K. Lawrence

Book ID: 121210566
Publisher: IEEE
Year: 2009
Weight: 179 KB
Category: Article
ISBN: 1424427819
DOI: 10.1109/VDAT.2009.5158089

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