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[IEEE 2009 International Semiconductor Device Research Symposium (ISDRS 2009) - College Park, MD (2009.12.9-2009.12.11)] 2009 International Semiconductor Device Research Symposium - Analytical modeling of the gate tunneling leakage for the determination of adequate high-K dielectrics in 22 nm double-gate SOI MOSFETs

✍ Scribed by Darbandy, G.; Ritzenthaler, R.; Lime, F.; Garduo, S.I.; Estrada, M.; Cerdeira, A.; Iiguez, B.

Book ID: 121367520
Publisher: IEEE
Year: 2009
Weight: 135 KB
Category: Article
ISBN: 1424460301
DOI: 10.1109/ISDRS.2009.5378235

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