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[IEEE 2009 International Semiconductor Device Research Symposium (ISDRS 2009) - College Park, MD (2009.12.9-2009.12.11)] 2009 International Semiconductor Device Research Symposium - Scaling of the SOI field effect diode (FED) for memory application

✍ Scribed by Yang Yang, ; Gangopadhyay, Aveek; Qiliang Li, ; Ioannou, Dimitris E

Book ID: 121185481
Publisher: IEEE
Year: 2009
Weight: 299 KB
Category: Article
ISBN: 1424460301
DOI: 10.1109/ISDRS.2009.5378045

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