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[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Test point insertion using functional flip-flops to drive control points

✍ Scribed by Yang, Joon-Sung; Nadeau-Dostie, Benoit; Touba, Nur A.

No coin nor oath required. For personal study only.

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