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[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Fast extended test access via JTAG and FPGAs

✍ Scribed by Devadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund

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