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[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Voltage transient detection and induction for debug and test

✍ Scribed by Petersen, Rex; Pant, Pankaj; Lopez, Pablo; Barton, Aaron; Ignowski, Jim; Josephson, Doug

No coin nor oath required. For personal study only.

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