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[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Capture power reduction using clock gating aware test generation

✍ Scribed by Chakravadhanula, Krishna; Chickermane, Vivek; Keller, Brion; Gallagher, Patrick; Narang, Prashant

No coin nor oath required. For personal study only.

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