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[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - A novel array-based test methodology for local process variation monitoring

✍ Scribed by Luo, Tseng-Chin; Chao, Mango C.-T.; Wu, Michael S.-Y.; Li, Kuo-Tsai; Hsia, Chin. C.; Tseng, Huan-Chi; Huang, Chuen-Uan; Chang, Yuan-Yao; Pan, Samuel C.; Young, Konrad K.-L.

Book ID: 126631174
Publisher: IEEE
Year: 2009
Weight: 816 KB
Category: Article
ISBN: 1424448689
DOI: 10.1109/TEST.2009.5355656

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