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[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Compression based on deterministic vector clustering of incompatible test cubes

✍ Scribed by Mrugalski, G.; Mukherjee, N.; Rajski, J.; Czysz, D.; Tyszer, J.

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