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[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - A study of dielectric breakdown mechanism in CoFeB/MgO/CoFeB magnetic tunnel junction

✍ Scribed by Yoshida, Chikako; Kurasawa, Masaki; Lee, Young Min; Tsunoda, Koji; Aoki, Masaki; Sugiyama, Yoshihiro

No coin nor oath required. For personal study only.

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