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[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - A two-stage model for negative bias temperature instability

✍ Scribed by Grasser, T.; Kaczer, B.; Goes, W.; Aichinger, Th.; Hehenberger, Ph.; Nelhiebel, M.

Book ID: 118185793
Publisher: IEEE
Year: 2009
Weight: 636 KB
Volume: 0
Category: Article
ISBN: 1424428882
DOI: 10.1109/irps.2009.5173221

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