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[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Reliability of high performance standard two-edge and radiation hardened by design enclosed geometry transistors

✍ Scribed by McLain, Michael L.; Barnaby, Hugh J.; Esqueda, Ivan S.; Oder, Jonathan; Vermeire, Bert

Book ID: 118161078
Publisher: IEEE
Year: 2009
Weight: 698 KB
Volume: 0
Category: Article
ISBN: 1424428882
DOI: 10.1109/irps.2009.5173247

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