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[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Comparison of alpha-particle and neutron-induced combinational and sequential logic error rates at the 32nm technology node

✍ Scribed by Gill, B.; Seifert, N.; Zia, V.

Book ID: 118007534
Publisher: IEEE
Year: 2009
Weight: 287 KB
Volume: 0
Category: Article
ISBN: 1424428882
DOI: 10.1109/irps.2009.5173251

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