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[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Neutron- and alpha-particle induced soft-error rates for flip flops at a 40 nm technology node

✍ Scribed by Jagannathan, Srikanth; Loveless, T. D.; Diggins, Z.; Bhuva, B. L.; Wen, S-J.; Wong, R.; Massengill, L. W.

Book ID: 118147949
Publisher: IEEE
Year: 2011
Weight: 375 KB
Volume: 0
Category: Article
ISBN: 1424491134
DOI: 10.1109/irps.2011.5784598

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