✦ LIBER ✦

[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Analysis of multiple cell upsets due to neutrons in SRAMs for a Deep-N-well process

✍ Scribed by Mahatme, Nihaar; Bhuva, Bharat; Fang, Y-P; Oates, Anthony

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2011 IEEE International Reliabilit

✍ Roy, Tania; Zhang, En Xia; Fleetwood, Daniel M.; Schrimpf, Ronald D.; Puzyrev, Y 📂 Article 📅 2011 🏛 IEEE ⚖ 301 KB

[IEEE 2011 IEEE International Reliabilit

✍ Chen, Min; Reddy, Vijay; Carulli, John; Krishnan, Srikanth; Rentala, Vijay; Srin 📂 Article 📅 2011 🏛 IEEE ⚖ 441 KB

[IEEE 2011 IEEE International Reliabilit

✍ Harada, Ryo; Mitsuyama, Yukio; Hashimoto, Masanori; Onoye, Takao 📂 Article 📅 2011 🏛 IEEE ⚖ 188 KB

[IEEE 2011 IEEE International Reliabilit

✍ Bari, Daniele; Wrachien, Nicola; Cester, Andrea; Meneghesso, Gaudenzio; Tagliafe 📂 Article 📅 2011 🏛 IEEE ⚖ 308 KB

[IEEE 2011 IEEE International Reliabilit

✍ Dongaonkar, Sourabh; Alam, Muhammad A; Karthik, Y; Mahapatra, Souvik; Wang, Dape 📂 Article 📅 2011 🏛 IEEE ⚖ 817 KB

[IEEE 2011 IEEE International Reliabilit

✍ Randriamihaja, Y. Mamy; Zaka, A.; Huard, V.; Rafik, M.; Rideau, D.; Roy, D.; Bra 📂 Article 📅 2011 🏛 IEEE ⚖ 351 KB