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[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - The modified P+ electrode layout schemes to enhance esd robustness of SCR structure for PMIC applications

✍ Scribed by Chen, Lu-An; Wang, Chang-Tzu; Lai, Tai-Hsiang; Tang, Tien-Hao; Su, Kuan-Cheng

Book ID: 115529897
Publisher: IEEE
Year: 2011
Weight: 389 KB
Volume: 0
Category: Article
ISBN: 1424491134
DOI: 10.1109/irps.2011.5784564

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