𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Asymmetry of RTS characteristics along source-drain direction and statistical analysis of process-induced RTS

✍ Scribed by Abe, Kenichi; Kumagai, Yuki; Sugawa, Shigetoshi; Watabe, Shunichi; Fujisawa, Takafumi; Teramoto, Akinobu; Ohmi, Tadahiro

Book ID: 118045513
Publisher: IEEE
Year: 2009
Weight: 465 KB
Volume: 0
Category: Article
ISBN: 1424428882
DOI: 10.1109/irps.2009.5173398

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2009 IEEE International Reliabilit

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - A two-stage model for negative bias temperature instability

✍ Grasser, T.; Kaczer, B.; Goes, W.; Aichinger, Th.; Hehenberger, Ph.; Nelhiebel, 📂 Article 📅 2009 🏛 IEEE ⚖ 636 KB

[IEEE 2009 IEEE International Reliabilit

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Qualification issues and pitfalls for advanced semiconductor devices in space

✍ Sunderland, David A. 📂 Article 📅 2009 🏛 IEEE ⚖ 402 KB

[IEEE 2009 IEEE International Reliabilit

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Reliability of high performance standard two-edge and radiation hardened by design enclosed geometry transistors

✍ McLain, Michael L.; Barnaby, Hugh J.; Esqueda, Ivan S.; Oder, Jonathan; Vermeire 📂 Article 📅 2009 🏛 IEEE ⚖ 698 KB

[IEEE 2009 IEEE International Reliabilit

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Comparison of alpha-particle and neutron-induced combinational and sequential logic error rates at the 32nm technology node

✍ Gill, B.; Seifert, N.; Zia, V. 📂 Article 📅 2009 🏛 IEEE ⚖ 287 KB

[IEEE 2009 IEEE International Reliabilit

[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - A new automated methodology for random telegraph signal identification and characterization: a case study on phase change memory arrays

✍ Chimenton, A.; Zambelli, C.; Olivo, P. 📂 Article 📅 2009 🏛 IEEE ⚖ 731 KB