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[IEEE 2009 IEEE International Integrated Reliability Workshop (IRW) - South Lake Tahoe, CA, USA (2009.10.18-2009.10.22)] 2009 IEEE International Integrated Reliability Workshop Final Report - Hot-carrier reliability study and simulation methodology development for 65nm technology

✍ Scribed by ManjulaRani, K.N.; Mooraka, Ram Mohan; Patel, Nayan; Samanta, Santanu; Narasimhan, Geetha; Lakshminarayanan, N.; Kapre, Ravindra; Puchner, Helmut

Book ID: 121273127
Publisher: IEEE
Year: 2009
Weight: 331 KB
Category: Article
ISBN: 1424439213
DOI: 10.1109/IRWS.2009.5383015

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