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[IEEE 2009 IEEE International Integrated Reliability Workshop (IRW) - South Lake Tahoe, CA, USA (2009.10.18-2009.10.22)] 2009 IEEE International Integrated Reliability Workshop Final Report - TCAD analysis of self heating in AlGaN/GaN HEMTs under pulsed conditions

✍ Scribed by Weatherford, T.; Wang, Y.; Tracey, S.

Book ID: 111939456
Publisher: IEEE
Year: 2009
Weight: 373 KB
Volume: 0
Category: Article
ISBN: 1424439213
DOI: 10.1109/irws.2009.5383005

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