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[IEEE 2009 IEEE 59th Electronic Components and Technology Conference (ECTC 2009) - San Diego, CA, USA (2009.05.26-2009.05.29)] 2009 59th Electronic Components and Technology Conference - Reliability assessment of electronic components under random vibration loading

โœ Scribed by Al-Yafawi, Abdullah; Yu, Da; Park, Seungbae; Pitarresi, James; Chung, Soonwan


Book ID
121090271
Publisher
IEEE
Year
2009
Weight
977 KB
Category
Article
ISBN
1424444756

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