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[IEEE 2009 2nd International Workshop on Electron Devices and Semiconductor Technology (IEDST) - Mumbai, India (2009.06.1-2009.06.2)] 2009 2nd International Workshop on Electron Devices and Semiconductor Technology - Recent advances in charge trap flash memories

✍ Scribed by Sandhya, C.; Singh, P. K.; Gupta, S.; Rohra, H.; Shivatheja, M.; Ganguly, U.; Hofmann, R.; Mukhopadhyay, G.; Mahapatra, S.; Vasi, J.

Book ID: 126611778
Publisher: IEEE
Year: 2009
Weight: 624 KB
Category: Article
ISBN: 1424438314
DOI: 10.1109/EDST.2009.5166101

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