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[IEEE 2009 2nd International Workshop on Electron Devices and Semiconductor Technology (IEDST) - Mumbai, India (2009.06.1-2009.06.2)] 2009 2nd International Workshop on Electron Devices and Semiconductor Technology - Study of charge density at InxGa1-xN/GaN heterostructure interface

✍ Scribed by Upal, Tasbirun Nahian; Uddin, Md. Ahsan; Hossain, Mainul; Jahan, Faisal; Mahmood, Zahid Hasan

Book ID: 120276746
Publisher: IEEE
Year: 2009
Weight: 565 KB
Category: Article
ISBN: 1424438314
DOI: 10.1109/EDST.2009.5166107

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